FT-IR spektrometrs

With over fifty years of experience in infrared spectroscopy, JASCO offers a series of advanced FT-IR instruments and sampling accessories. JASCO provides the most complete selection of FT-IR capability from education and routine analysis to high performance research systems plus specially optimized dedicated systems for advanced technology applications such as measuring film thickness and CVD in-situ monitoring for semiconductor research.

The JASCO FT/IR-4000 and FT/IR-6000 Series redefine the application of this powerful, easy-to-use technique. Each compact model offers reliable operation with the highest signal-to-noise ratio in the industry. Featuring a highly stable interferometer and AccuTrac™ DSP technology enabling rapid and accurate tracking of mirror position and velocity for optimum signal-to-noise performance.