Park Systems is the leading nanotechnology solutions partner for the most accurate AFM results. It is leading the new era of AFMs for nanoscale metrology. Our original and innovative AFM solutions have enabled the use of atomic force microscopes in the most challenging problems of nanoscale research and industrial production.

XE series AFM has several advantaged comparison to other AFM available on market.

The world’s most accurate atomic force microscope (AFM) Park Systems NX10

Data accuracy is of paramount importance to nanotechnology researchers as the credibility of their research depends upon accurate results. The NX10, the world’s most accurate AFM, is the flagship AFM of Park Systems’ new product line. The NX10 brings unparalleled imaging accuracy, scan speeds, and tip life to the next generation of researchers, all at an affordable price. The new user interface features improved user friendliness and ease of use, while the new hardware features metal components that are thermally matched to reduce drift.

The main features of our new product are:

Accurate AFM Imaging by Crosstalk Elimination
• Industry leading XYZ scan linearity with two independent flexure scanners for sample and tip
• Best out-of-plane motion of less than 1 nm over entire XY scan range
• Z scanner linearity of less than 0.015%

Accurate AFM Scan by True Non-Contact Mode^TM
• Industry leading Z-scanner bandwidth of more than 9 kHz, or Z-servo speed of more than 62 mm/sec tip velocity
• Minimized sample damage or modification

Accurate AFM Measurement by True Sample Topography^TM
• Sample topography measured by industry leading low noise Z detector
• Minimized system drift and hysteresis by thermally matched components

NX User Productivity
• Easy tip exchange with wide open side access to the tip and sample and intuitive laser alignment with pre-aligned tip mount and patented on-axis, top down view
• Fast automatic tip approach to sample surface within 10 seconds